5

Defect-oriented diagnosis for very deep-submicron systems

Year:
2001
Language:
english
File:
PDF, 53 KB
english, 2001
18

Online testing approach for very deep-submicron ICs

Year:
2002
Language:
english
File:
PDF, 246 KB
english, 2002
22

Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates

Year:
2004
Language:
english
File:
PDF, 130 KB
english, 2004
23

Concurrent checking of clock signal correctness

Year:
1998
Language:
english
File:
PDF, 115 KB
english, 1998